Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single-nanowire X-ray diffraction
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Title
Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single-nanowire X-ray diffraction
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 45, Issue 2, Pages 239-244
Publisher
International Union of Crystallography (IUCr)
Online
2012-03-15
DOI
10.1107/s0021889812003007
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