Charge transition levels of carbon-, oxygen-, and hydrogen-related defects at the SiC/SiO2interface through hybrid functionals
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Title
Charge transition levels of carbon-, oxygen-, and hydrogen-related defects at the SiC/SiO2interface through hybrid functionals
Authors
Keywords
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Journal
PHYSICAL REVIEW B
Volume 84, Issue 23, Pages -
Publisher
American Physical Society (APS)
Online
2011-12-30
DOI
10.1103/physrevb.84.235320
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