Thickness and grain size dependence of the strength of copper thin films as investigated with bulge tests and nanoindentations

Title
Thickness and grain size dependence of the strength of copper thin films as investigated with bulge tests and nanoindentations
Authors
Keywords
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Journal
PHILOSOPHICAL MAGAZINE
Volume 92, Issue 25-27, Pages 3172-3187
Publisher
Informa UK Limited
Online
2012-05-14
DOI
10.1080/14786435.2012.685773

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