Gate-bias stress-dependent photoconductive characteristics of multi-layer MoS2 field-effect transistors
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Title
Gate-bias stress-dependent photoconductive characteristics of multi-layer MoS2 field-effect transistors
Authors
Keywords
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Journal
NANOTECHNOLOGY
Volume 25, Issue 15, Pages 155201
Publisher
IOP Publishing
Online
2014-03-19
DOI
10.1088/0957-4484/25/15/155201
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