Calibrated complex impedance and permittivity measurements with scanning microwave microscopy

Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

(2012) A. Imtiaz et al.   JOURNAL OF APPLIED PHYSICS

Calibrated nanoscale dopant profiling using a scanning microwave microscope

(2012) H. P. Huber et al.   JOURNAL OF APPLIED PHYSICS

Near-field microwave scanning probe imaging of conductivity inhomogeneities in CVD graphene

(2012) Alexander Tselev et al.   NANOTECHNOLOGY

Label-free identification of single dielectric nanoparticles and viruses with ultraweak polarization forces

(2012) Laura Fumagalli et al.   NATURE MATERIALS

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

(2010) H. P. Huber et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Quantitative Nanoscale Dielectric Microscopy of Single-Layer Supported Biomembranes

(2009) Laura Fumagalli et al.   NANO LETTERS

Nanoscale capacitance microscopy of thin dielectric films

(2008) G. Gomila et al.   JOURNAL OF APPLIED PHYSICS