Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope

Published 2008 View Full Article

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Title
Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 79, Issue 6, Pages 063703
Publisher
AIP Publishing
Online
2008-06-26
DOI
10.1063/1.2949109

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