Atom-Probe Tomography of Semiconductor Materials and Device Structures

Tomographic study of atomic-scale redistribution of platinum during the silicidation of Ni0.95Pt0.05/Si(100) thin films

(2009) Praneet Adusumilli et al.   APPLIED PHYSICS LETTERS

Direct measurement of dopant distribution in an individual vapour–liquid–solid nanowire

(2009) Daniel E. Perea et al.   Nature Nanotechnology

Impurity measurements in silicon with D-SIMS and atom probe tomography

(2008) P. Ronsheim et al.   APPLIED SURFACE SCIENCE

Nanowire Transistor Performance Limits and Applications

(2008) Wei Lu et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Three-dimensional atom probe analysis of green- and blue-emitting InxGa1−xN∕GaN multiple quantum well structures

(2008) M. J. Galtrey et al.   JOURNAL OF APPLIED PHYSICS

Tomographic analysis of dilute impurities in semiconductor nanostructures

(2008) D.E. Perea et al.   JOURNAL OF SOLID STATE CHEMISTRY

Atom probe tomography of Ni silicides: First stages of reaction and redistribution of Pt

(2008) D. Mangelinck et al.   MICROELECTRONIC ENGINEERING

Secondary Ion Mass Spectrometry of Vapor−Liquid−Solid Grown, Au-Catalyzed, Si Wires

(2008) Morgan C. Putnam et al.   NANO LETTERS