Tomographic analysis of dilute impurities in semiconductor nanostructures

Published 2008 View Full Article

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Title
Tomographic analysis of dilute impurities in semiconductor nanostructures
Authors
Keywords
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Journal
JOURNAL OF SOLID STATE CHEMISTRY
Volume 181, Issue 7, Pages 1642-1649
Publisher
Elsevier BV
Online
2008-06-08
DOI
10.1016/j.jssc.2008.06.007

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