In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2
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Title
In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2
Authors
Keywords
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Journal
MICROSCOPY AND MICROANALYSIS
Volume 21, Issue 01, Pages 140-153
Publisher
Cambridge University Press (CUP)
Online
2014-12-22
DOI
10.1017/s1431927614013555
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