MIMC reliability and electrical behavior defined by a physical layer property of the dielectric

Published 2008 View Full Article

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Title
MIMC reliability and electrical behavior defined by a physical layer property of the dielectric
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 48, Issue 8-9, Pages 1553-1556
Publisher
Elsevier BV
Online
2008-08-23
DOI
10.1016/j.microrel.2008.06.043

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