MIMC reliability and electrical behavior defined by a physical layer property of the dielectric

标题
MIMC reliability and electrical behavior defined by a physical layer property of the dielectric
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 48, Issue 8-9, Pages 1553-1556
出版商
Elsevier BV
发表日期
2008-08-23
DOI
10.1016/j.microrel.2008.06.043

向作者/读者发起求助以获取更多资源

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started