Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers

Damage-Free Photoemission Study of Conducting Carbon Composite Electrode Using Ar Gas Cluster Ion Beam Sputtering Process

(2012) Dong-Jin Yun et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers

(2012) Peter J. Cumpson et al.   SURFACE AND INTERFACE ANALYSIS

TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

(2011) Sadia Rabbani et al.   ANALYTICAL CHEMISTRY

Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams

(2010) Takuya Miyayama et al.   SURFACE AND INTERFACE ANALYSIS

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

(2009) J. L. S. Lee et al.   ANALYTICAL CHEMISTRY

Cluster secondary ion mass spectrometry of polymers and related materials

(2009) Christine M. Mahoney   MASS SPECTROMETRY REVIEWS

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

(2009) Satoshi Ninomiya et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY