Damage-Free Photoemission Study of Conducting Carbon Composite Electrode Using Ar Gas Cluster Ion Beam Sputtering Process

Multiwall Carbon Nanotube and Poly(3,4-ethylenedioxythiophene): Polystyrene Sulfonate (PEDOT:PSS) Composite Films for Transistor and Inverter Devices

(2011) Dong-Jin Yun et al.   ACS Applied Materials & Interfaces

Interface Engineering for Organic Electronics

(2010) Hong Ma et al.   ADVANCED FUNCTIONAL MATERIALS

X-ray photoelectron spectroscopy study of polyimide thin films with Ar cluster ion depth profiling

(2010) T. Miyayama et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams

(2010) Takuya Miyayama et al.   SURFACE AND INTERFACE ANALYSIS

Conducting polymer/carbon nanotube composite as counter electrode of dye-sensitized solar cells

(2008) Benhu Fan et al.   APPLIED PHYSICS LETTERS

Surface depth analysis for fluorinated block copolymer films by X-ray photoelectron spectroscopy using C60 cluster ion beam

(2008) Keiji Tanaka et al.   APPLIED SURFACE SCIENCE

Metal–semiconductor contact in organic thin film transistors

(2008) Shi-Woo Rhee et al.   JOURNAL OF MATERIALS CHEMISTRY

Thermal degradation mechanisms of PEDOT:PSS

(2008) E VITORATOS et al.   ORGANIC ELECTRONICS