Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements

Enhanced electrical properties at boundaries including twin boundaries of polycrystalline CdTe thin-film solar cells

(2015) H. Li et al.   PHYSICAL CHEMISTRY CHEMICAL PHYSICS

Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology

(2014) Atif Imtiaz et al.   IEEE MICROWAVE MAGAZINE

Grain-Boundary-Enhanced Carrier Collection in CdTe Solar Cells

(2014) Chen Li et al.   PHYSICAL REVIEW LETTERS

Direct Imaging of Cl- and Cu-Induced Short-Circuit Efficiency Changes in CdTe Solar Cells

(2014) Jonathan D. Poplawsky et al.   Advanced Energy Materials

The Nanometer-Resolution Local Electrical Potential and Resistance Mapping of CdTe Thin Films

(2013) C.-S. Jiang et al.   IEEE Journal of Photovoltaics

Batch-fabricated cantilever probes with electrical shielding for nanoscale dielectric and conductivity imaging

(2012) Yongliang Yang et al.   JOURNAL OF MICROMECHANICS AND MICROENGINEERING

Radiative efficiency of state-of-the-art photovoltaic cells

(2011) Martin A. Green   PROGRESS IN PHOTOVOLTAICS

Cryogenic microwave imaging of metal–insulator transition in doped silicon

(2011) Worasom Kundhikanjana et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Nanoscale microwave microscopy using shielded cantilever probes

(2011) Keji Lai et al.   Applied Nanoscience

Hierarchy of Electronic Properties of Chemically Derived and Pristine Graphene Probed by Microwave Imaging

(2009) Worasom Kundhikanjana et al.   NANO LETTERS

Calibration of shielded microwave probes using bulk dielectrics

(2008) K. Lai et al.   APPLIED PHYSICS LETTERS

Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope

(2008) K. Lai et al.   REVIEW OF SCIENTIFIC INSTRUMENTS