Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements

标题
Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 107, Issue 14, Pages 142106
出版商
AIP Publishing
发表日期
2015-10-09
DOI
10.1063/1.4932952

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