Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C- and Si- faces of SiC
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Title
Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C- and Si- faces of SiC
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 107, Issue 12, Pages 121603
Publisher
AIP Publishing
Online
2015-09-24
DOI
10.1063/1.4931725
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