X-ray photoelectron spectroscopy (XPS) and diffraction (XPD) study of a few layers of graphene on 6H-SiC(0001)

Published 2013 View Full Article

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Title
X-ray photoelectron spectroscopy (XPS) and diffraction (XPD) study of a few layers of graphene on 6H-SiC(0001)
Authors
Keywords
-
Journal
SURFACE SCIENCE
Volume 615, Issue -, Pages 47-56
Publisher
Elsevier BV
Online
2013-04-20
DOI
10.1016/j.susc.2013.04.006

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