Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C- and Si- faces of SiC

标题
Voltage contrast X-ray photoelectron spectroscopy reveals graphene-substrate interaction in graphene devices fabricated on the C- and Si- faces of SiC
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 107, Issue 12, Pages 121603
出版商
AIP Publishing
发表日期
2015-09-24
DOI
10.1063/1.4931725

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