Far-field high-energy diffraction microscopy: a tool for intergranular orientation and strain analysis

Precision of lattice strain and orientation measurements using high-energy monochromatic X-ray diffraction

(2011) John K. Edmiston et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

A method for measuring single-crystal elastic moduli using high-energy X-ray diffraction and a crystal-based finite element model

(2010) C. Efstathiou et al.   ACTA MATERIALIA

Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction

(2010) Jette Oddershede et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Load partitioning between single bulk grains in a two-phase duplex stainless steel during tensile loading

(2009) Peter Hedström et al.   ACTA MATERIALIA

Friedel-pair based indexing method for characterization of single grains with hard X-rays

(2009) M. Moscicki et al.   MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

In situ single-grain peak profile measurements on Ti–7Al during tensile deformation

(2009) U. Lienert et al.   MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

Defect evolution and pore collapse in crystalline energetic materials

(2009) Nathan R Barton et al.   MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING

Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

(2009) W. Ludwig et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Reconstruction of Single-Grain Orientation Distribution Functions for Crystalline Materials

(2009) Per Christian Hansen et al.   SIAM Journal on Imaging Sciences

Dislocation Density Tensor Characterization of Deformation Using 3D X-Ray Microscopy

(2008) B. C. Larson et al.   JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME

Probing Microstructure Dynamics With X-Ray Diffraction Microscopy

(2008) R. M. Suter et al.   JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME

Quantitative Stress Analysis of Recrystallized OFHC Cu Subject to Deformation In Situ

(2008) Joel V. Bernier et al.   JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME

Synchrotron applications of an amorphous silicon flat-panel detector

(2008) John H. Lee et al.   JOURNAL OF SYNCHROTRON RADIATION

Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction

(2008) J.V. Bernier et al.   METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE

Direct observation of 3-D grain growth in Al–0.1% Mn

(2008) S. Schmidt et al.   SCRIPTA MATERIALIA