Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis

Published 2009 View Full Article

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Title
Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 80, Issue 3, Pages 033905
Publisher
AIP Publishing
Online
2009-03-20
DOI
10.1063/1.3100200
References
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