Precision of lattice strain and orientation measurements using high-energy monochromatic X-ray diffraction

Title
Precision of lattice strain and orientation measurements using high-energy monochromatic X-ray diffraction
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 44, Issue 2, Pages 299-312
Publisher
International Union of Crystallography (IUCr)
Online
2011-02-01
DOI
10.1107/s0021889811002123

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