Raman characterization of the structural evolution in amorphous and partially nanocrystalline hydrogenated silicon thin films prepared by PECVD

Polymorphous silicon thin films obtained by plasma-enhanced chemical vapor deposition using dichlorosilane as silicon precursor

(2009) A Remolina et al.   NANOTECHNOLOGY

P-induced nanocrystallite dispersion in amorphous-nanocrystalline mixed-phase Si:H thin films

(2008) C.-S. Jiang et al.   JOURNAL OF APPLIED PHYSICS

Electron irradiation effects on the properties of heavily phosphorus-doped a-Si : H films prepared from undiluted silane

(2008) N M Liao et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Study of strain and wetting phenomena in porous silicon by Raman scattering

(2008) M. A. Ferrara et al.   JOURNAL OF RAMAN SPECTROSCOPY

Structure and 1/f noise of boron doped polymorphous silicon films

(2008) S B Li et al.   NANOTECHNOLOGY

The role of dangling bonds in the electronic and vibrational properties of hydrogenated amorphous silicon nitrides (a-Si –xNx : H)

(2007) Rosario Sergio Cataliotti et al.   JOURNAL OF RAMAN SPECTROSCOPY