Quantitative measurements of internal electric fields with differential phase contrast microscopy on InGaN/GaN quantum well structures

On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material

(2015) Ian MacLaren et al.   ULTRAMICROSCOPY

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

(2014) Knut Müller et al.   Nature Communications

Differential phase-contrast microscopy at atomic resolution

(2012) Naoya Shibata et al.   Nature Physics

Differential phase contrast 2.0—Opening new “fields” for an established technique

(2012) Matthias Lohr et al.   ULTRAMICROSCOPY

Reduction of internal polarization fields in InGaN quantum wells by InGaN/AlGaN ultra-thin superlattice barriers with different indium composition

(2011) Young-Kyun Noh et al.   JOURNAL OF APPLIED PHYSICS

Local thickness measurement through scattering contrast and electron energy-loss spectroscopy

(2011) Huai-Ruo Zhang et al.   MICRON

Spontaneous polarization field in polar and nonpolar GaInN/GaN quantum well structures

(2011) M. Thomsen et al.   PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS

Composition mapping in InGaN by scanning transmission electron microscopy

(2011) Andreas Rosenauer et al.   ULTRAMICROSCOPY

Experimental and Theoretical Considerations of Polarization Field Direction in Semipolar InGaN/GaN Quantum Wells

(2010) Mitsuru Funato et al.   Applied Physics Express

Determination of Piezoelectric Fields Across InGaN/GaN Quantum Wells by Means of Electron Holography

(2010) Masashi Deguchi et al.   JOURNAL OF ELECTRONIC MATERIALS

Polarization field mapping of Al0.85In0.15N/AlN/GaN heterostructure

(2009) Lin Zhou et al.   APPLIED PHYSICS LETTERS

Measurement of specimen thickness and composition in AlxGa1-xN/GaN using high-angle annular dark field images

(2009) Andreas Rosenauer et al.   ULTRAMICROSCOPY