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Title
A hybrid memristor-CMOS XOR gate for nonvolatile logic computation
Authors
Keywords
-
Journal
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
Volume 213, Issue 4, Pages 1050-1054
Publisher
Wiley
Online
2015-12-03
DOI
10.1002/pssa.201532872
References
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Related references
Note: Only part of the references are listed.- Realization of Boolean Logic Functionality Using Redox-Based Memristive Devices
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- (2015) Simone Balatti et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Normally-off Logic Based on Resistive Switches—Part II: Logic Circuits
- (2015) Simone Balatti et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Magnetic non-volatile flip-flop with spin-Hall assistance
- (2015) Zhaohao Wang et al. Physica Status Solidi-Rapid Research Letters
- A learnable parallel processing architecture towards unity of memory and computing
- (2015) H. Li et al. Scientific Reports
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- (2015) Yi Li et al. Advanced Electronic Materials
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- (2015) Thomas Breuer et al. Advanced Electronic Materials
- Exploiting Memristive BiFeO3Bilayer Structures for Compact Sequential Logics
- (2014) Tiangui You et al. ADVANCED FUNCTIONAL MATERIALS
- AgInSbTe memristor with gradual resistance tuning
- (2013) J. J. Zhang et al. APPLIED PHYSICS LETTERS
- Memristor-Based Neural Logic Blocks for Nonlinearly Separable Functions
- (2013) Michael Soltiz et al. IEEE TRANSACTIONS ON COMPUTERS
- Nonvolatile “AND,” “OR,” and “NOT” Boolean logic gates based on phase-change memory
- (2013) Y. Li et al. JOURNAL OF APPLIED PHYSICS
- Memristive XOR for resistive multiplier
- (2012) S. Shin et al. ELECTRONICS LETTERS
- Beyond von Neumann—logic operations in passive crossbar arrays alongside memory operations
- (2012) E Linn et al. NANOTECHNOLOGY
- Memristive devices for computing
- (2012) J. Joshua Yang et al. Nature Nanotechnology
- ‘Memristive’ switches enable ‘stateful’ logic operations via material implication
- (2010) Julien Borghetti et al. NATURE
- Circuit Elements With Memory: Memristors, Memcapacitors, and Meminductors
- (2009) Massimiliano Di Ventra et al. PROCEEDINGS OF THE IEEE
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