4.2 Article

Digital pattern generator: an electron-optical MEMS for massively parallel reflective electron beam lithography

Journal

Publisher

SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
DOI: 10.1117/1.JMM.12.3.031107

Keywords

electron-optics; microelectromechanical systems; submicron lithography

Funding

  1. Defense Advanced Research Projects Agency [HR0011-07-9-0007]
  2. U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences
  3. Office of High Energy Physics [DE-AC02-06CH11357]

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The digital pattern generator (DPG) is a complex electron-optical MEMS that pixelates the electron beam in the reflective electron beam lithography (REBL) e-beam column. It potentially enables massively parallel printing, which could make REBL competitive with optical lithography. The development of the REBL DPG, from the CMOS architecture, through the lenslet modeling and design, to the fabrication of the MEMS device, is described in detail. The imaging and printing results are also shown, which validate the pentode lenslet concept and the fabrication process. (C) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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