Microstructural variation and high-speed impact responses of Sn–3.0Ag–0.5Cu/ENEPIG solder joints with ultra-thin Ni–P deposit
Published 2012 View Full Article
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Title
Microstructural variation and high-speed impact responses of Sn–3.0Ag–0.5Cu/ENEPIG solder joints with ultra-thin Ni–P deposit
Authors
Keywords
Solder Joint, Impact Toughness, Solder Alloy, IMCs Layer, Interfacial IMCs
Journal
JOURNAL OF MATERIALS SCIENCE
Volume 48, Issue 6, Pages 2724-2732
Publisher
Springer Nature
Online
2012-12-19
DOI
10.1007/s10853-012-7070-2
References
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- Comparative Study of ENIG and ENEPIG as Surface Finishes for a Sn-Ag-Cu Solder Joint
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- Interfacial reaction and elemental redistribution in Sn3.0Ag0.5Cu–xPd/immersion Au/electroless Ni solder joints after aging
- (2011) I-Tai Wang et al. Materials Science and Engineering B-Advanced Functional Solid-State Materials
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- Influence of Palladium Thickness on the Soldering Reactions Between Sn-3Ag-0.5Cu and Au/Pd(P)/Ni(P) Surface Finish
- (2010) W. H. Wu et al. JOURNAL OF ELECTRONIC MATERIALS
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- (2010) Kai-Jheng Wang et al. JOURNAL OF ELECTRONIC MATERIALS
- Dependence of Electrical Resistivity on Temperature and Sn Content in Pb-Sn Solders
- (2010) E. ÇadIrlI et al. JOURNAL OF ELECTRONIC MATERIALS
- Strong effect of Pd concentration on the soldering reaction between Ni and Sn–Pd alloys
- (2010) Cheng En Ho et al. JOURNAL OF MATERIALS RESEARCH
- Crystallization Behaviour of Electroless Ni-P UBM with Medium Phosphorous Induced by Single and Step Heat Treatment
- (2010) Han-Byul Kang et al. MATERIALS TRANSACTIONS
- Detailed Phase Evolution of a Phosphorous-Rich Layer and Formation of the Ni-Sn-P Compound in Sn-Ag-Cu/Electroplated Ni-P Solder Joints
- (2009) Yung-Chi Lin et al. JOURNAL OF ELECTRONIC MATERIALS
- Surface Finish Effects on High-Speed Signal Degradation
- (2008) Xin Wu et al. IEEE TRANSACTIONS ON ADVANCED PACKAGING
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