Analysis of the residual stress distribution in AlGaN/GaN high electron mobility transistors

Effect of substrate-induced strain in the transport properties of AlGaN/GaN heterostructures

(2010) M. Azize et al.   JOURNAL OF APPLIED PHYSICS

AlGaN/GaN HFET reliability

(2009) Robert Trew et al.   IEEE MICROWAVE MAGAZINE

Raman studies of GaN/sapphire thin film heterostructures

(2009) Anwar Hushur et al.   JOURNAL OF APPLIED PHYSICS

GaN HEMT reliability

(2009) J.A. del Alamo et al.   MICROELECTRONICS RELIABILITY

X-ray diffraction of III-nitrides

(2009) M A Moram et al.   REPORTS ON PROGRESS IN PHYSICS

Biaxial stress-dependent optical band gap, crystalline, and electronic structure in wurtzite ZnO: Experimental and ab initio study

(2008) Y. F. Li et al.   JOURNAL OF APPLIED PHYSICS