Role of native defects in nitrogen flux dependent carrier concentration of InN films grown by molecular beam epitaxy

Title
Role of native defects in nitrogen flux dependent carrier concentration of InN films grown by molecular beam epitaxy
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 112, Issue 7, Pages 073510
Publisher
AIP Publishing
Online
2012-10-05
DOI
10.1063/1.4757031

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