Evolution of cell resistance, threshold voltage and crystallization temperature during cycling of line-cell phase-change random access memory

Title
Evolution of cell resistance, threshold voltage and crystallization temperature during cycling of line-cell phase-change random access memory
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 110, Issue 2, Pages 024505
Publisher
AIP Publishing
Online
2011-07-23
DOI
10.1063/1.3603025

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