Evolution of cell resistance, threshold voltage and crystallization temperature during cycling of line-cell phase-change random access memory

标题
Evolution of cell resistance, threshold voltage and crystallization temperature during cycling of line-cell phase-change random access memory
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 110, Issue 2, Pages 024505
出版商
AIP Publishing
发表日期
2011-07-23
DOI
10.1063/1.3603025

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