Ultra-thin dielectric breakdown in devices and circuits: A brief review

标题

作者

关键词

Breakdown statistics, Circuit lifetime prediction, Compact model, Magnetic tunnel junction (MTJ), Time-dependent dielectric breakdown (TDDB), Ultra-thin dielectric

出版物

MICROELECTRONICS RELIABILITY

Volume 55, Issue 2, Pages 308-317

出版商

Elsevier BV

发表日期

2014-11-21

DOI

10.1016/j.microrel.2014.10.019

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