Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models
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Title
Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON RELIABILITY
Volume 62, Issue 2, Pages 338-350
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-04-17
DOI
10.1109/tr.2013.2257055
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