Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process

Authors

Keywords

Journal

Volume 60, Issue 1, Pages 234-245

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2010-11-24

DOI

10.1109/tr.2010.2087430

Explore over 38,000 international journals covering a vast array of academic fields.

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started