Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes

Published 2009 View Full Article

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Title
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON RELIABILITY
Volume 58, Issue 4, Pages 611-618
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-11-20
DOI
10.1109/tr.2009.2033734
References
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