A 200 °C Universal Gate Driver Integrated Circuit for Extreme Environment Applications

Published 2012 View Full Article

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Title
A 200 °C Universal Gate Driver Integrated Circuit for Extreme Environment Applications
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON POWER ELECTRONICS
Volume 27, Issue 9, Pages 4153-4162
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-02-16
DOI
10.1109/tpel.2012.2187934
References
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