An Ultra-Low Reset Current Cross-Point Phase Change Memory With Carbon Nanotube Electrodes

Low-Power Switching of Phase-Change Materials with Carbon Nanotube Electrodes

(2011) F. Xiong et al.   SCIENCE

Phase-change random access memory: A scalable technology

(2010) S. Raoux et al.   IBM JOURNAL OF RESEARCH AND DEVELOPMENT

A Unified Hopping Model for Subthreshold Current of Phase-Change Memories in Amorphous State

(2010) Alessandro Calderoni et al.   IEEE ELECTRON DEVICE LETTERS

Horizontally aligned carbon nanotube bundles for interconnect application: diameter-dependent contact resistance and mean free path

(2010) Yang Chai et al.   NANOTECHNOLOGY

Complementary resistive switches for passive nanocrossbar memories

(2010) Eike Linn et al.   NATURE MATERIALS

Phase Change Memory

(2010) H.-S. Philip Wong et al.   PROCEEDINGS OF THE IEEE

Estimation of amorphous fraction in multilevel phase-change memory cells

(2010) N. Papandreou et al.   SOLID-STATE ELECTRONICS

Inducing chalcogenide phase change with ultra-narrow carbon nanotube heaters

(2009) Feng Xiong et al.   APPLIED PHYSICS LETTERS

Thermal conductivities and phase transition temperatures of various phase-change materials measured by the 3ω method

(2009) W. P. Risk et al.   APPLIED PHYSICS LETTERS

Thermal Boundary Resistance Measurements for Phase-Change Memory Devices

(2009) J.P. Reifenberg et al.   IEEE ELECTRON DEVICE LETTERS

Transient Characteristics of the Reset Programming of a Phase-Change Line Cell and the Effect of the Reset Parameters on the Obtained State

(2009) Ludovic Goux et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Synthesis and size-dependent crystallization of colloidal germanium telluridenanoparticles

(2009) Marissa A. Caldwell et al.   JOURNAL OF MATERIALS CHEMISTRY

Simple and accurate model for voltage–dependent resistance of metallic carbon nanotube interconnects: An ab initio study

(2009) Serhan Yamacli et al.   PHYSICS LETTERS A

A 90 nm 1.8 V 512 Mb Diode-Switch PRAM With 266 MB/s Read Throughput

(2008) Kwang-Jin Lee et al.   IEEE JOURNAL OF SOLID-STATE CIRCUITS

Phase change materials and their application to random access memory technology

(2008) Simone Raoux et al.   MICROELECTRONIC ENGINEERING