Thermal Boundary Resistance Measurements for Phase-Change Memory Devices

Title
Thermal Boundary Resistance Measurements for Phase-Change Memory Devices
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 1, Pages 56-58
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-11-24
DOI
10.1109/led.2009.2035139

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