Electrical and Reliability Characteristics of High-$\kappa~{\rm HoTiO}_{3}~\alpha$-InGaZnO Thin-Film Transistors

Published 2014 View Full Article

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Journal

IEEE ELECTRON DEVICE LETTERS

Volume 35, Issue 1, Pages 66-68

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2014-01-04

DOI

10.1109/led.2013.2287349

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