Electrical Conduction and Reliability in Dual-Layered Graphene Heterostructure Interconnects

Published 2014 View Full Article

Authors

Keywords

Journal

IEEE ELECTRON DEVICE LETTERS

Volume 35, Issue 12, Pages 1311-1313

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2014-10-21

DOI

10.1109/led.2014.2360815

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IEEE ELECTRON DEVICE LETTERS

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