Contactless Thermal Boundary Resistance Measurement of GaN-on-Diamond Wafers

Published 2014 View Full Article

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Title
Contactless Thermal Boundary Resistance Measurement of GaN-on-Diamond Wafers
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 35, Issue 10, Pages 1007-1009
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-09-17
DOI
10.1109/led.2014.2350075

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