Suppression in negative bias illumination stress instability of zinc tin oxide transistor by insertion of thermal TiOx films

Published 2013 View Full Article

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Title
Suppression in negative bias illumination stress instability of zinc tin oxide transistor by insertion of thermal TiOx films
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 34, Issue 2, Pages 253-255
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-01-05
DOI
10.1109/led.2012.2230242

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