A Single-Photon Avalanche Diode in 90-nm CMOS Imaging Technology With 44% Photon Detection Efficiency at 690 nm

Published 2012 View Full Article

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Title
A Single-Photon Avalanche Diode in 90-nm CMOS Imaging Technology With 44% Photon Detection Efficiency at 690 nm
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 33, Issue 5, Pages 694-696
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-03-20
DOI
10.1109/led.2012.2187420
References
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