A Single-Photon Avalanche Diode in 90-nm CMOS Imaging Technology With 44% Photon Detection Efficiency at 690 nm

出版年份 2012 全文链接

标题

作者

关键词

出版物

Volume 33, Issue 5, Pages 694-696

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2012-03-20

DOI

10.1109/led.2012.2187420

参考文献

查看 3 条相关文献

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started