Positive Bias-Induced $V_{\rm th}$ Instability in Graphene Field Effect Transistors

Title
Positive Bias-Induced $V_{\rm th}$ Instability in Graphene Field Effect Transistors
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 33, Issue 3, Pages 339-341
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-02-04
DOI
10.1109/led.2011.2181150

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