Long-Endurance Nanocrystal $\hbox{TiO}_{2}$ Resistive Memory Using a TaON Buffer Layer

Authors

Keywords

Journal

Volume 32, Issue 12, Pages 1749-1751

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2011-10-25

DOI

10.1109/led.2011.2168939

References

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