Robust High-Resistance State and Improved Endurance of $\hbox{HfO}_{X}$ Resistive Memory by Suppression of Current Overshoot

Published 2011 View Full Article

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Title
Robust High-Resistance State and Improved Endurance of $\hbox{HfO}_{X}$ Resistive Memory by Suppression of Current Overshoot
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 32, Issue 11, Pages 1585-1587
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-10-04
DOI
10.1109/led.2011.2166051
References
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