Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films

Published 2009 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 30, Issue 12, Pages 1269-1271
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-11-04
DOI
10.1109/led.2009.2032937

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.