High-Performance Al–Sn–Zn–In–O Thin-Film Transistors: Impact of Passivation Layer on Device Stability

Published 2010 View Full Article

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Title
High-Performance Al–Sn–Zn–In–O Thin-Film Transistors: Impact of Passivation Layer on Device Stability
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 2, Pages 144-146
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-01-05
DOI
10.1109/led.2009.2036944
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