Metal–Semiconductor–Metal Ultraviolet Photodetectors Based on $\hbox{TiO}_{2}$ Films Deposited by Radio-Frequency Magnetron Sputtering

Authors

Keywords

Journal

Volume 31, Issue 6, Pages 588-590

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2010-04-16

DOI

10.1109/led.2010.2045876

References

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