Analysis of Negative Bias Temperature Instability in Body-Tied Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Published 2008 View Full Article

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Title
Analysis of Negative Bias Temperature Instability in Body-Tied Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 29, Issue 2, Pages 165-167
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-01-26
DOI
10.1109/led.2007.914083

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